K. Nallamshetty et al., SUPERMODULUS EFFECT IN CU MN MULTILAYER FILMS, Materials science & engineering. B, Solid-state materials for advanced technology, 20(3), 1993, pp. 120000005-120000007
The Young modulus of Cu/Mn metallic multilayer films has been investig
ated for bilayer wavelengths in the range 4-18 nm. The multilayer film
s, deposited by electron beam evaporation, exhibit an appreciable incr
ease in Young modulus (supermodulus effect). The bilayer wavelength de
pendence of the Young modulus shows an oscillatory behaviour.