THE STRUCTURE OF TITANIUM SILICATE-GLASSES INVESTIGATED BY SI K-EDGE X-RAY-ABSORPTION SPECTROSCOPY

Citation
Gs. Henderson et Me. Fleet, THE STRUCTURE OF TITANIUM SILICATE-GLASSES INVESTIGATED BY SI K-EDGE X-RAY-ABSORPTION SPECTROSCOPY, Journal of non-crystalline solids, 211(3), 1997, pp. 214-221
Citations number
41
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00223093
Volume
211
Issue
3
Year of publication
1997
Pages
214 - 221
Database
ISI
SICI code
0022-3093(1997)211:3<214:TSOTSI>2.0.ZU;2-1
Abstract
The structure of glasses along the TjO(2)-SiO2 join, have been investi gated using Si K-edge extended X-ray absorption fine structure spectro scopy (EXAFS) and W-ray absorption near-edge spectroscopy (XANES). XAN ES spectra of glasses along the TiO2-SiO2 join indicate that the Si en vironment is similar in all glasses. The addition of TiO2 has little a ffect on the SiO2 network and there is Ilo significant distortion of t he SiO, tetrahedron nor change in Si-O-Si bond angle. The calculated S i-O bond distance remains at about 1.60 even up to 11.6 mol% (14.9 wt% ) TiO2: well within the metastable glass region. No evidence is observ ed fur the formation of Ti clusters.