Gs. Henderson et Me. Fleet, THE STRUCTURE OF TITANIUM SILICATE-GLASSES INVESTIGATED BY SI K-EDGE X-RAY-ABSORPTION SPECTROSCOPY, Journal of non-crystalline solids, 211(3), 1997, pp. 214-221
The structure of glasses along the TjO(2)-SiO2 join, have been investi
gated using Si K-edge extended X-ray absorption fine structure spectro
scopy (EXAFS) and W-ray absorption near-edge spectroscopy (XANES). XAN
ES spectra of glasses along the TiO2-SiO2 join indicate that the Si en
vironment is similar in all glasses. The addition of TiO2 has little a
ffect on the SiO2 network and there is Ilo significant distortion of t
he SiO, tetrahedron nor change in Si-O-Si bond angle. The calculated S
i-O bond distance remains at about 1.60 even up to 11.6 mol% (14.9 wt%
) TiO2: well within the metastable glass region. No evidence is observ
ed fur the formation of Ti clusters.