In this article we describe a new type of powder diffractometer that g
ives a significant improvement in count rate over existing methods. Th
e key to the new technique is the use of a flat, diffracted beam monoc
hromator in combination with a position sensitive detector. The incide
nt x rays fall on a flat plate or capillary sample and multiple diffra
ction lines are reflected by the monochromator out of the equatorial p
lane onto a position sensitive detector. Since the monochromator is tu
ned for the incident beam energy, background from fluorescence or othe
r scattering is eliminated and data can be recorded over a range of se
veral degrees thereby providing a large improvement in counting effici
ency over conventional diffractometers. This new method is also compar
ed to a previous article which employed a focusing analyzer crystal an
d position sensitive detector.