CHARACTERIZATION OF AN X-RAY STREAK CAMERA AT 18.2NM

We report on measurements of the dynamic range and the spatial resolut ion in streaked mode for a Kentech 2 x magnifying XUV/x-ray streak cam era. The Balmer-alpha line at 18.2 nm from a laser-produced carbon pla sma, attenuated by a thin-film copper step wedge, is used to generate the input photon flux of varying intensity on the 0.5 mm x 20 mm Csl p hotocathode. For x-ray pulse durations between 400 ps and 4.0 ns the d ynamic range is found to vary between 180 and 2 x 10(4) with a spatial resolution along the photocathode of 7 lp/mm. Calibration of the stre ak rates in combination with a proximity focused image intensifier com pletes the characterization.