ATOMIC-FORCE MICROSCOPE INVESTIGATION OF C-60 ADSORBED ON SILICON ANDMICA

The morphological and frictional characteristics of C60 adsorbed on si licon and mica surfaces have been investigated using atomic force micr oscopy (AFM). Deposition of fullerenes by vacuum sublimation results i n uniform coverage of microcrystallites with an average size between 4 0 and 60 nm. Small area scans on the top of these microcrystallites sh ow disordered arrangements of molecules. Frictional measurements carri ed out monitoring buckling of the AFM cantilever show increased fricti on for C60-covered surfaces over that of clean substrates. At sufficie ntly high forces, the film was selectively displaced by the AFM tip, s o that fine patterns could be drawn on fullerene-covered surfaces.