X-RAY-DIFFRACTION CHARACTERIZATION OF TERNARY ARTIFICIAL SUPERLATTICES

Citation
I. Goldfarb et al., X-RAY-DIFFRACTION CHARACTERIZATION OF TERNARY ARTIFICIAL SUPERLATTICES, Journal of applied physics, 74(4), 1993, pp. 2501-2506
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
74
Issue
4
Year of publication
1993
Pages
2501 - 2506
Database
ISI
SICI code
0021-8979(1993)74:4<2501:XCOTAS>2.0.ZU;2-Z
Abstract
Thin films of alternating Au, Ag, and Cu wedge-shaped metal layers wer e made by magnetron sputtering in order to develop a method for invest igation of a multicomponent systems. X-ray-diffraction patterns of all as-deposited samples revealed satellites in the vicinity of (111) ref lections, evidence of composition-modulated artificial superlattice fo rmation. The experimental spectra are well explained by the kinematica l diffraction theory for imperfect superlattices. Computer simulations have demonstrated extremely high sensitivity to the fluctuations DELT AH/H of the superlattice period H. As a result, a rapid and simple met hod of DELTAH/H determination is proposed.