MODELING OF PHOTOREFLECTANCE PHENOMENA IN LAYERED MEDIA

Citation
M. Liu et al., MODELING OF PHOTOREFLECTANCE PHENOMENA IN LAYERED MEDIA, Semiconductor science and technology, 8(8), 1993, pp. 1639-1647
Citations number
20
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
8
Issue
8
Year of publication
1993
Pages
1639 - 1647
Database
ISI
SICI code
0268-1242(1993)8:8<1639:MOPPIL>2.0.ZU;2-H
Abstract
This paper presents a detailed three-dimensional analysis for the mode lling of the photoreflectance effect, in particular the response of la yered. samples is considered. The dependence of the photoreflectance s ignal on various parameters such as lifetime, surface recombination ve locity and carrier diffusion coefficient is discussed. It is shown tha t the carrier diffusion coefficient and the thermal diffusivity play a n important role in determining the signal level from the photoreflect ance system. The effects of the wavelength of the pump and probe beams are also discussed. Furthermore, a last numerical algorithm, allowing for a rapid computational evaluation, has been applied.