THERMALLY STIMULATED CURRENT STUDY OF THE MICROSTRUCTURE OF PEEK

Citation
M. Mourguesmartin et al., THERMALLY STIMULATED CURRENT STUDY OF THE MICROSTRUCTURE OF PEEK, Journal of thermal analysis, 40(2), 1993, pp. 697-703
Citations number
11
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
03684466
Volume
40
Issue
2
Year of publication
1993
Pages
697 - 703
Database
ISI
SICI code
0368-4466(1993)40:2<697:TSCSOT>2.0.ZU;2-A
Abstract
Thermally Stimulated Current (TSC) spectroscopy and Differential Scann ing calorimetry (DSC) have been applied to the characterization of the microstructure of Poly (Ether Ether Ketone)/ PEEK. the dielectric rel axation spectra show two modes, dependent upon crystallinity: for the mode stuated in the vicinity of the glass transition temperature, two components have been distinguished and attributed to the molecular mob ility in the 'true amorphous phase' and in the 'rigid amorphous region '. below 0-degrees-C, two sub-modes appear, situated around -110-degre es-C and -75-degrees-C, due to the two different crystal entities, bea ds and laths.