SIMULTANEOUS MULTIPLE FILE EXAFS ANALYSIS - METHODOLOGY AND APPLICATION TO BURIED GE-SI INTERFACES

Authors
TYLISZCZAK T AEBI P HITCHCOCK AP JACKMAN TE BARIBEAU JM LOCKWOOD DJ
Citation
T. Tyliszczak et al., SIMULTANEOUS MULTIPLE FILE EXAFS ANALYSIS - METHODOLOGY AND APPLICATION TO BURIED GE-SI INTERFACES, JPN J A P 1, 32, 1993, pp. 134-136
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
32
Year of publication
1993
Supplement
32-2
Pages
134 - 136
Database
ISI
SICI code
Abstract
Procedures for constrained simultaneous non-linear least squares curve fits of multiple EXAFS spectra are described and their advantages dis cussed. The techniques are illustrated by polarisation-dependent Ge(k) EXAFS studies of buried Ge-Si interfaces in strained layer [(Si)m(Ge) n]p/Si(100) superlattices grown by molecular beam epitaxy (MBE).