EXAFS STUDIES OF LIQUID SEMICONDUCTORS

Authors
Citation
M. Inui, EXAFS STUDIES OF LIQUID SEMICONDUCTORS, JPN J A P 1, 32, 1993, pp. 165-169
Citations number
29
Categorie Soggetti
Physics, Applied
Volume
32
Year of publication
1993
Supplement
32-2
Pages
165 - 169
Database
ISI
SICI code
Abstract
EXAFS is a useful probe of studying the local structure of disordered systems. We have developed a new sample cell and carried out EXAFS mea surements for liquid semiconductors such as Se, Te and As2Se3, whose e lectronic properties often show metallic behaviour at high temperature s and pressures. EXAFS has been found to give useful information on th e neighboring configuration around a central atom as long as the atoms are covalently bonded.