The key experimental parameters associated with the quick--scanning EX
AFS (QEXAFS) technique have been examined systematically to arrive at
a critical evaluation of the ''speed limit'' of this technique. With c
urrent technology, a 1000 eV EXAFS scan can be measured in 5-20 second
s, and a 100 eV XANES spectrum in 1-2 seconds, depending on the crysta
l monochromator used and actual energy range to be scanned. Further de
velopment is needed to achieve sub-second time resolution with this te
chnique.