RECENT IMPROVEMENTS IN LABORATORY XAFS FACILITY

Authors
NISHIHAGI K KAWABATA A TANIGUCHI K
Citation
K. Nishihagi et al., RECENT IMPROVEMENTS IN LABORATORY XAFS FACILITY, JPN J A P 1, 32, 1993, pp. 258-260
Citations number
1
Categorie Soggetti
Physics, Applied
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
32
Year of publication
1993
Supplement
32-2
Pages
258 - 260
Database
ISI
SICI code
Abstract
It has been said that Laboratory XAFS measurement takes long time due to weak X-Ray source and that it is not suitable for XANES measurement due to its poor resolution. However,recently, some improvements and d evelopments, i. e. highly brilliant X-Ray source, LaB6 cathode, high s peed counting circuit,engineering workstation etc.have been realizing competitive performance and measurement circumstances with SR(Synchrot ron Radiation).