K. Omote et al., A LABORATORY EXAFS STUDY WITH HIGHER-ORDER BRAGG REFLECTION BY MEANS OF THE FLUORESCENCE MONITORING TECHNIQUE, JPN J A P 1, 32, 1993, pp. 264-266
A Laboratory EXAFS study has been tested by using higher-order Bragg r
eflections of Ge(440), Ge(333) and Ge(444). A single crystal spectrome
ter was employed and the incident x-ray intensity was monitored by mea
suring the fluorescent radiation from a suitable material placed in fr
ont of a sample. Good EXAFS spectra were obtained for relatively heavy
elements of Se, Y and Zr with this technique. In addition, high inten
sity photon fluxes have been obtained, which are 6 and 3 times stronge
r than the case of double-crystal spectrometer at photon energies of 1
2 and 16 keV, respectively.