A LABORATORY EXAFS SPECTROMETER FOR HIGH-TEMPERATURE MOLTEN MATERIALS

Authors
OMOTE K TOHJI K WASEDA Y KIKU A FUNAHASHI M
Citation
K. Omote et al., A LABORATORY EXAFS SPECTROMETER FOR HIGH-TEMPERATURE MOLTEN MATERIALS, JPN J A P 1, 32, 1993, pp. 267-269
Citations number
5
Categorie Soggetti
Physics, Applied
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
32
Year of publication
1993
Supplement
32-2
Pages
267 - 269
Database
ISI
SICI code
Abstract
A Laboratory EXAFS spectrometer for both as a single or double-crystal mode with a high-temperature furnace has been developed for obtaining the short-range ordering structure of molten materials. The surface o f molten materials is always held in the horizontal position by means of a vertical-type goniometer with a movable x-ray generator, so that the free surface of melts can be measured at temperatures higher than 1300-degrees-C in air. The usefulness of this apparatus has been confi rmed by obtaining an EXAFS spectrum of liquid Bi4Ge3O12.