IN-HOUSE MEASUREMENTS OF XAFS BY MEANS OF TOTAL-REFLECTION

We have developed a double channel-cut monochromator composed of two c hannel-cut Si(111) crystals, and obtained highly parallel and highly m onochromatized X-ray beam. Reflectivity of an As2Se3 film on an Al sub strate was measured as a function of photon glancing angle around the critical one of total reflection. The complex refractive index was det ermined so that the simulated Fresnel reflectivity fits the measured v alues. Since the imaginary part of the refractive index is correlated with the linear absorption coefficient, we can obtain XAFS spectrum by means of reflectivity measurements in house.