DOUBLE FLAT CRYSTAL SPECTROMETER IN DISPERSIVE ARRANGEMENT FOR LABORATORY XAFS SPECTROSCOPY

Authors
UEHARA Y KATAOKA M OGAMA T KAWABATA A NISHIHAGI K TANIGUCHI K
Citation
Y. Uehara et al., DOUBLE FLAT CRYSTAL SPECTROMETER IN DISPERSIVE ARRANGEMENT FOR LABORATORY XAFS SPECTROSCOPY, JPN J A P 1, 32, 1993, pp. 273-275
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
32
Year of publication
1993
Supplement
32-2
Pages
273 - 275
Database
ISI
SICI code
Abstract
A new XAFS spectrometer with a double flat crystal monocromator has be en developed. The energy resolution of the spectrometer is estimated t o be below 10eV at 20keV from the FWHM of Mo Kalpha1 line (17.479keV). Experiments under various temperature and vacuum conditions are possi ble with a movable rotating anode and a high vacuum type sample chambe r.