ELECTRON YIELD XAFS STUDY OF EVAPORATED CO PD MULTILAYERS WITH VARIOUS THICKNESS RATIOS OF CO TO PD SUBLAYERS - SIMULATIONS OF THE CO K-EDGE XAFS AND FOURIER-TRANSFORMS/

Electron-yield XAFS measurements were made on e-beam evaporated Co/Pd multilayers with various sublayer thicknesses and different thickness ratios of Co to Pd sublayers. The Co K-edge and the Pd K-edge XAFS dat a were obtained for the Co/Pd multilayers with the sublayer thicknesse s of 3angstrom/4angstrom, 15angstrom/4angstrom, 3angstrom/15angstrom, 2.1angstrom/13.5angstrom, and 2.2angstrom/4-5angstrom. The Fourier tra nsforms of the Co K XAFS for most samples show a splitting of major pe ak, and the magnitude ratio of these split peaks varies systematically with the thickness ratio of the Pd sublayer to the Co sublayer, where as the Fourier transforms of the Pd K XAFS for the same samples do not show a splitting of peaks. As a preliminary analysis, the Co K XAFS a nd the split peaks in the Fourier transform for the Co/Pd(3angstrom/4a ngstrom) case were simulated by using the FEFF calculations, and the C o K XAFS and the major peak in the fourier transform for the Co/Pd(15a ngstrom/4angstrom) case were also simulated consistently.