The ultimate information content of XAFS is discussed. The practical l
imits for obtaining this information are indicated. The most general c
ase is considered where nothing is known about the structure and there
is no orientation dependence of the XAFS with respect to the sample.
For close packed structures it ultimately appears possible to obtain t
he two and perhaps some of the three particle correlation distribution
functions between the center atom and the its first neighbors; two pa
rticle correlation distribution functions between the center atom and
its second nearest neighbors and possibly some of the three particle c
orrelation distribution functions between the center atom and its firs
t and second nearest neighbor atoms. By the fourth neighboring atoms i
t appears that only the two particle correlation distribution function
with the center atom is feasible. Beyond that the information content
in XAFS is overwhelmed by the large number of multiple scattering pat
hs contributing and it does not appear possible to obtain even the two
particle distribution functions. For open structures it appears to be
possible to obtain the two particle correlation distribution function
between the center atom and its first three neighboring shells of ato
ms and perhaps some three particle correlations. When some information
about the structure is known, or in special situations, it will be po
ssible to obtain restricted information beyond these limits. The more
brilliant future x-ray sources together with computing advances will m
ake feasible the combining of XAFS with other techniques such as micro
scopy and tomography to produce two or three dimensional imaging of th
e XAFS spectrum with submicron resolution. Time resolution of XAFS mea
surements in the nanosecond range appears feasible The time resolution
and the imaging will require automating the analysis of data to handl
e the overwhelming data content of such measurements. XAFS information
will be utilized in many more phenomena than presently. Hints of the
possibilities are seen in the fine structure of anomalous diffraction.
Otber future phenomena to be exploited are x-ray Raman scattering and
its combination with diffraction, fine structure in electron energy l
oss and its combination with diffraction. The polarization of x-rays,
both plane and circular, will be more intensely exploited, especially
when XAFS is combined with diffraction, etc., because richer orientati
on, spin, and site dependences exist. The most exciting future develop
ments may be awaiting the creative genius of the future scientific gen
eration and not foreseen here.