TIME-DEPENDENT DIELECTRIC-BREAKDOWN IN BATIO3 THIN-FILMS

Authors
DESU SB YOO IK
Citation
Sb. Desu et Ik. Yoo, TIME-DEPENDENT DIELECTRIC-BREAKDOWN IN BATIO3 THIN-FILMS, Journal of the Electrochemical Society, 140(9), 1993, pp. 120000133-120000135
Citations number
13
Categorie Soggetti
Electrochemistry
Journal title
Journal of the Electrochemical Society → ACNP
ISSN journal
00134651
Volume
140
Issue
9
Year of publication
1993
Pages
120000133 - 120000135
Database
ISI
SICI code
0013-4651(1993)140:9<120000133:TDIBT>2.0.ZU;2-X
Abstract
Electrical degradation followed by breakdown was studied for BaTiO3 th in films. A field-assisted thermal breakdown was observed which is rel ated to Poole-Frenkel emission. A semiquantitative electrical degradat ion/breakdown model is proposed on the basis of Poole-Frenkel emission and oxygen vacancy behavior during degradation. It is suggested that accumulation of oxygen vacancies at the cathode and acceptors at the a node forms a forward p-n junction which increases current leading to r esultant breakdown.