ELECTRON-STATES AT SEMICONDUCTOR INTERFACES - THE INTRINSIC AND EXTRINSIC CHARGE NEUTRALITY LEVELS

Citation
F. Flores et al., ELECTRON-STATES AT SEMICONDUCTOR INTERFACES - THE INTRINSIC AND EXTRINSIC CHARGE NEUTRALITY LEVELS, Philosophical transactions-Royal Society of London. Physical sciences and engineering, 344(1673), 1993, pp. 567-577
Citations number
36
Categorie Soggetti
Multidisciplinary Sciences
ISSN journal
09628428
Volume
344
Issue
1673
Year of publication
1993
Pages
567 - 577
Database
ISI
SICI code
0962-8428(1993)344:1673<567:EASI-T>2.0.ZU;2-6
Abstract
A discussion is presented on the semiconductor interface barrier forma tion. Schottky barriers and heterojunction band offsets are analysed b y means of the intrinsic and extrinsic charge neutrality levels. These levels are shown to be controlled by the interface geometry and its l ocal chemistry. The chemical properties and the charge neutrality leve ls of different Schottky barriers are presented. Heterojunction band o ffsets are also analysed and are shown to depend on the electronegativ ity of the metal intralayers deposited at the interface: more electron egative metal atoms tend to reduce the heterojunction band offsets.