SI NANOWIRE GROWTH WITH ULTRAHIGH-VACUUM SCANNING-TUNNELING-MICROSCOPY

Citation
T. Ono et al., SI NANOWIRE GROWTH WITH ULTRAHIGH-VACUUM SCANNING-TUNNELING-MICROSCOPY, Applied physics letters, 70(14), 1997, pp. 1852-1854
Citations number
6
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
70
Issue
14
Year of publication
1997
Pages
1852 - 1854
Database
ISI
SICI code
0003-6951(1997)70:14<1852:SNGWUS>2.0.ZU;2-C
Abstract
Using a scanning tunneling microscope (STM), Si nanowires were grown b y applying a voltage at a constant current between a Si substrate and a gold STM tip. Silicon atoms were deposited onto a gold tip by field evaporation. The field evaporation rate of silicon atoms was activated by heating the substrate. Silicon nanowire was grown on the gold tip at a substrate temperature of 700 degrees C. Nanowires could not be gr own on a clean tungsten tip when using a gold-free Si substrate. The p resence of gold atoms is important for the growth of silicon. Apparent ly, gold atoms deposited on the silicon substrate by field evaporation reduce the activation energy of field evaporation by attacking Si-Si bonds. (C) 1997 American Institute of Physics.