Several metallization systems for producing ohmic contacts onto GaSb h
ave been investigated. The minimization of contact resistivity was res
pectively obtained with Au-Zn on p type and Au-Te on n type. It has be
en shown that these results are due to an overdoped layer at the semic
onductor surface. Low frequency noise measurements pointed out that th
e techniques used allow the realization of devices without 1/f contact
noise.