AUTOMATIC CALIBRATION OF INDUCTIVE VOLTAGE DIVIDERS FOR THE NASA ZENOEXPERIMENT

Two inductive voltage dividers (IVDs) used for temperature measurement s in NASA's Zeno experiment were tested. In order to obtain the requir ed resolution of 10 parts-per-billion, a 30-bit binary inductive volta ge divider developed at the National Institute of Standards and Techno logy was used to measure the differential linearity of the Zeno IVDs. Automatic measurements were performed on the dividers in the Zeno engi neering model at frequencies of 266 and 351 Hz over a ratio range of 0 .55-0.56. The measured differential linearity limits the temperature r esolution to 5 muK.