2 SCANNING TUNNELING MICROSCOPE DEVICES FOR LARGE SAMPLES

Authors
PICOTTO GB DESOGUS S BARBATO G
Citation
Gb. Picotto et al., 2 SCANNING TUNNELING MICROSCOPE DEVICES FOR LARGE SAMPLES, Review of scientific instruments, 64(9), 1993, pp. 2699-2701
Citations number
7
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
64
Issue
9
Year of publication
1993
Pages
2699 - 2701
Database
ISI
SICI code
0034-6748(1993)64:9<2699:2STMDF>2.0.ZU;2-S
Abstract
Two scanning tunneling microscopes (STMs) operating in air were design ed for imaging samples with dimensions up to 75 mm diam and 25 mm thic kness. Both STMs allow a wide sampling range capability to be obtained by means of xy sample positioning stages spanning 25 mm with 0.1 mum resolution. The automatic tip-sample approach is achieved in the two d evices by moving either the head scanning stage or the sample bolder. These STMs were successfully used to image highly oriented pyrolithic graphite, gratings, and indentations made on hardened steel.