CHARACTERIZATION OF SI-SIO2 INTERFACE STATES - COMPARISON BETWEEN DIFFERENT CHARGE-PUMPING AND CAPACITANCE TECHNIQUES

The three-level and spectroscopic charge pumping techniques, deep leve l transient spectroscopy and capacitance-voltage measurements are both used to determine the energy distribution of Si-SiO2 interface states on submicrometer metal-oxide-semiconductor field-effect transistors a nd metal-oxide-semiconductor capacitors. This study is a systematic co mparative analysis between charge pumping techniques and capacitance m easurements. The measurements have been performed on different structu res (n- and p-type materials, low and high interface states densities) and the performances of each technique have been compared.