CAPACITANCE-VOLTAGE CHARACTERISTICS OF SUPERLATTICES

Citation
Vy. Aleshkin et al., CAPACITANCE-VOLTAGE CHARACTERISTICS OF SUPERLATTICES, Semiconductors, 27(6), 1993, pp. 504-507
Citations number
7
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637826
Volume
27
Issue
6
Year of publication
1993
Pages
504 - 507
Database
ISI
SICI code
1063-7826(1993)27:6<504:CCOS>2.0.ZU;2-0
Abstract
Capacitance-voltage characteristics of a Schottky contact have been de termined for a structure with a periodic sequence of quantum wells sep arated by tunnel-opaque barriers. At low temperatures the voltage depe ndence of the capacitance was found to be stepped with a constant jump of the reciprocal capacitance. A method for finding the surface densi ty of electrons in quantum wells from the capacitance-voltage characte ristics has been proposed. It was found that penetration of the electr ic field from the schottky barrier into the structure could have an os cillatory coordinate dependence.