NEW MODIFICATION OF X-RAY STANDING WAVES ABOVE THE SURFACE OF LAYEREDSUBSTRATES UNDER TOTAL EXTERNAL REFLECTION CONDITIONS FOR STRUCTURAL CHARACTERIZATION OF ORGANIC LAYERS

Authors
ZHELUDEVA SI KOVALCHUK MV NOVIKOVA NN SOSPHENOV AN MALYSHEVA NE SALASHCHENKO NN AKHSAKHALYAN AD PLATONOV YY
Citation
Si. Zheludeva et al., NEW MODIFICATION OF X-RAY STANDING WAVES ABOVE THE SURFACE OF LAYEREDSUBSTRATES UNDER TOTAL EXTERNAL REFLECTION CONDITIONS FOR STRUCTURAL CHARACTERIZATION OF ORGANIC LAYERS, Thin solid films, 232(2), 1993, pp. 252-255
Citations number
10
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
232
Issue
2
Year of publication
1993
Pages
252 - 255
Database
ISI
SICI code
0040-6090(1993)232:2<252:NMOXSW>2.0.ZU;2-Z
Abstract
Information about the structure of organic monolayers of fatty acid sa lts and phospholipids deposited by the Langmuir-Blodgett technique on layered substrates has been obtained for the first time with the help of amplitude-modulated X-ray standing waves formed under total externa l reflection conditions. The detailed E field intensity distribution a s well as the advantages of such a new modification of X-ray standing waves are discussed.