POSSIBLE ELECTRICAL DOUBLE-LAYER CONTRIBUTION TO THE EQUILIBRIUM THICKNESS OF INTERGRANULAR GLASS-FILMS IN POLYCRYSTALLINE CERAMICS

Citation
Dr. Clarke et al., POSSIBLE ELECTRICAL DOUBLE-LAYER CONTRIBUTION TO THE EQUILIBRIUM THICKNESS OF INTERGRANULAR GLASS-FILMS IN POLYCRYSTALLINE CERAMICS, Journal of the American Ceramic Society, 76(5), 1993, pp. 1201-1204
Citations number
7
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00027820
Volume
76
Issue
5
Year of publication
1993
Pages
1201 - 1204
Database
ISI
SICI code
0002-7820(1993)76:5<1201:PEDCTT>2.0.ZU;2-4
Abstract
The plausibility of the entropic repulsion of electrical double layers acting to stabilize an equilibrium thickness of intergranular glass f ilms in polycrystalline ceramics is explored. Estimates of the screeni ng length, surface potential, and surface charge required to provide a repulsive force sufficiently large to balance the attractive van der Waals and capillary forces for observable thicknesses of intergranular film are calculated and do not appear to be beyond possibility. Howev er, it has yet to be established whether crystalline particles in a li quid-phase sintering medium possess an electrical double layer at high temperatures. If they do, such a surface charge layer may well have i mportant consequences not only for liquid-phase sintering but also for high-frequency electrical properties and microwave sintering of ceram ics containing a liquid phase.