A new ion-selective thin-film membrane for ion-sensitive field-effect
structures has been realized. Silver iodide (AgI) as an iodide-sensiti
ve material has been vacuum evaporated onto semiconductor-insulator su
bstrates. Various preconditioning and vacuum evaporation parameters as
well as post treatment conditions were tested. Sensitivity and select
ivity of these model field-effect structures were investigated by capa
citance-voltage (CV) measurements. Nernstian behaviour, good selectivi
ty and a high lifetime comparable with that of the ion-selective elect
rode (ISE) could be obtained. This method of membrane fabrication is e
xpected to be suitable for the large scale manufacture of sensor chips
.