FLUCTUATIONS OF THE AU-SI(100) SCHOTTKY-BARRIER HEIGHT

Schottky barrier height fluctuations of Au films on Si(100) are direct ly imaged with nm-scale resolution by ballistic electron emission. Flu ctuations are made visible by using a highly doped (N(d) almost-equal- to 10(17) cm-3) substrate. Randomly distributed (approximately 10(13) cm-1) spots (about 2 nm in diameter) of reduced barrier height (typica l DELTAPHI=20-50 meV) are observed. The microscopic distribution of ba rrier heights effective in emission is consistent with mean barrier he ight values measured by standard techniques.