EVIDENCE FOR SITE-SENSITIVE SCREENING OF CORE HOLES AT THE SI AND GE (001) SURFACE

Citation
E. Pehlke et M. Scheffler, EVIDENCE FOR SITE-SENSITIVE SCREENING OF CORE HOLES AT THE SI AND GE (001) SURFACE, Physical review letters, 71(14), 1993, pp. 2338-2341
Citations number
27
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
71
Issue
14
Year of publication
1993
Pages
2338 - 2341
Database
ISI
SICI code
0031-9007(1993)71:14<2338:EFSSOC>2.0.ZU;2-I
Abstract
Typically surface core-level shifts (SCLS) of clean surfaces are expla ined in the initial-state model, thus ignoring the screening of the ph oton-induced hole. We will show that this approach is not valid for th e (001) surfaces of Si and Ge. Using ab initio density-functional theo ry we calculate the SCLS from differences of total energies of slabs c ontaining excited atoms at different positions at the surface and in t he bulk. Comparison with initial-state results reveals an enhanced scr eening at the surface, which is even remarkably different for the two atoms forming the surface dimer.