VANADIUM DIOXIDE THIN-FILMS PREPARED BY CHEMICAL-VAPOR-DEPOSITION FROM VANADIUM(III) ACETYLACETONATE

Citation
T. Maruyama et Y. Ikuta, VANADIUM DIOXIDE THIN-FILMS PREPARED BY CHEMICAL-VAPOR-DEPOSITION FROM VANADIUM(III) ACETYLACETONATE, Journal of Materials Science, 28(18), 1993, pp. 5073-5078
Citations number
9
Categorie Soggetti
Material Science
ISSN journal
00222461
Volume
28
Issue
18
Year of publication
1993
Pages
5073 - 5078
Database
ISI
SICI code
0022-2461(1993)28:18<5073:VDTPBC>2.0.ZU;2-E
Abstract
Vanadium dioxide thin films were prepared by an atmospheric-pressure c hemical vapour deposition method. The raw material was vanadium(III) a cetylacetonate. Polycrystalline thin films were obtained at a reaction temperature of 500-degrees-C. Slow post-deposition cooling of the dep osits on a substrate of fused quartz or sapphire single crystal yields vanadium dioxide films which are not mixed with other phases, i.e. V3 O7 or V4O9. Optical and electrical switching behaviours strongly depen d on film thickness. At a film thickness of about 300 nm the transitio n temperature showed a minimum value of 44-degrees-C.