APPLICATION OF TIME AND TEMPERATURE RESOLVED X-RAY-DIFFRACTION (TRXRD) TO THERMAL-ANALYSIS

Authors
ENGEL W EISENREICH N ALONSO M KOLARIK V
Citation
W. Engel et al., APPLICATION OF TIME AND TEMPERATURE RESOLVED X-RAY-DIFFRACTION (TRXRD) TO THERMAL-ANALYSIS, Journal of thermal analysis, 40(3), 1993, pp. 1017-1024
Citations number
15
Categorie Soggetti
Chemistry Analytical
Journal title
Journal of thermal analysis → ACNP
ISSN journal
03684466
Volume
40
Issue
3
Year of publication
1993
Pages
1017 - 1024
Database
ISI
SICI code
0368-4466(1993)40:3<1017:AOTATR>2.0.ZU;2-8
Abstract
The application of TRXRD for thermal analysis is demonstrated using ex amples of phase transitions, solid-state reactions and high-temperatur e corrosion. The measuring system produces a series of diffraction pat terns, which are evaluated by a difference procedure that a reduces th e data to curves comparable to DSC and TG curves and thus suited to ki netic evaluation.