RELIABILITY OF RESULTS OBTAINED IN MEASURING THE MINORITY CHARGE-CARRIER LIFETIME IN SEMICONDUCTORS BY THE PEM EFFECT METHOD

Authors
VIRYASOVA TB GARNYK VS NAUMOV AV ISAIKIN VD RAUKHMAN MR KISELEVA NN
Citation
Tb. Viryasova et al., RELIABILITY OF RESULTS OBTAINED IN MEASURING THE MINORITY CHARGE-CARRIER LIFETIME IN SEMICONDUCTORS BY THE PEM EFFECT METHOD, Measurement techniques, 36(1), 1993, pp. 69-71
Citations number
3
Categorie Soggetti
Instument & Instrumentation",Engineering
Journal title
Measurement techniques → ACNP
ISSN journal
05431972
Volume
36
Issue
1
Year of publication
1993
Pages
69 - 71
Database
ISI
SICI code
0543-1972(1993)36:1<69:ROROIM>2.0.ZU;2-Y