Kvr. Prasad et al., GROWTH AND FERROELECTRIC PROPERTIES OF BI2VO5.5 THIN-FILMS WITH METALLIC LANIO3 ELECTRODES, Applied physics letters, 63(14), 1993, pp. 1898-1900
Novel ferroelectric bismuth vanadate, Bi2VO5.5 (BVO), thin films have
been grown between lattice matched metallic LaNiO3 (LNO) layers deposi
ted on SrTiO3 (STO) by the pulsed laser deposition technique. LNO/Bvo/
LNO/STO and Au/BVO/LNO/STO trilayer structures exhibited c-oriented (0
01) growth of BVO. LNO has been found to be a good metallic electrode
with sheet resistance approximately 20 OMEGA in addition to aiding c-a
xis oriented BVO growth. The dielectric constant, epsilon(r) of LNO/BV
O/LNO/STO, at 300 K was about 12. However, when an Au electrode was us
ed on top of BVO/LNO/STO film, it showed a significant improvement in
the dielectric constant (epsilon(r) = 123). The ferroelectric properti
es of BVO thin films have been confirmed by hysteresis behavior with a
remnant polarization, P(r) = 4.6 X 10(-8) C/cm2 and coercive field, E
(c) = 23 kV/cm at 300 K.