S. Lombardo et al., ROOM-TEMPERATURE LUMINESCENCE FROM ER-IMPLANTED SEMIINSULATING POLYCRYSTALLINE SILICON, Applied physics letters, 63(14), 1993, pp. 1942-1944
Semi-insulating polycrystalline silicon films with oxygen concentratio
ns in the range 4-27 at. % were deposited by low-pressure chemical vap
or deposition of SiH4 and N2O onto silicon substrates, annealed at 920
-degrees-C, and then implanted with 2 X 10(15) 500 keV Er ions/cm2. Af
ter annealing at temperatures in the range 300-900-degrees-C, the samp
les show intense room-temperature luminescence around 1.54 mum, charac
teristic of intra-4f emission from Er3+, upon excitation using an Ar i
on laser. The luminescence intensity increases with increasing oxygen
concentration in the film. The luminescence is attributed to Er3+ ions
in oxygen-rich shells around Si nanograins, excited by a photocarrier
-mediated process.