ROOM-TEMPERATURE LUMINESCENCE FROM ER-IMPLANTED SEMIINSULATING POLYCRYSTALLINE SILICON

Citation
S. Lombardo et al., ROOM-TEMPERATURE LUMINESCENCE FROM ER-IMPLANTED SEMIINSULATING POLYCRYSTALLINE SILICON, Applied physics letters, 63(14), 1993, pp. 1942-1944
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
63
Issue
14
Year of publication
1993
Pages
1942 - 1944
Database
ISI
SICI code
0003-6951(1993)63:14<1942:RLFESP>2.0.ZU;2-P
Abstract
Semi-insulating polycrystalline silicon films with oxygen concentratio ns in the range 4-27 at. % were deposited by low-pressure chemical vap or deposition of SiH4 and N2O onto silicon substrates, annealed at 920 -degrees-C, and then implanted with 2 X 10(15) 500 keV Er ions/cm2. Af ter annealing at temperatures in the range 300-900-degrees-C, the samp les show intense room-temperature luminescence around 1.54 mum, charac teristic of intra-4f emission from Er3+, upon excitation using an Ar i on laser. The luminescence intensity increases with increasing oxygen concentration in the film. The luminescence is attributed to Er3+ ions in oxygen-rich shells around Si nanograins, excited by a photocarrier -mediated process.