DETERMINATION OF CHARACTERISTIC MAGNETOTRANSISTOR PARAMETERS BY MEASUREMENT AND INVERSE MODELING

We report on the development and validation of a methodology that allo ws the easy, reliable and destruction-free extraction of characteristi c magnetotransistor parameters from the completely processed devices. The required experimental set-up is inexpensive, easy to build up and integrable in existing parameter analyser systems. The proposed evalua tion methods have been verified on the basis of measurements as well a s on exact two-dimensional numerical simulations. Implementation in a suitable parameter extraction software will allow standardized and aut omated measurements to be carried out.