Spectroscopic measurements at infrared and visible wavelengths are wid
ely used as a tool for laboratory analysis. Due to technological impro
vements, more and more possibilities are opened for making similar met
hodology feasible for direct on-line process measurements in harsh ind
ustrial conditions or small portable equipment. New optoelectronic com
ponents together with compact design can even be used to realize integ
rated sensor-like analyser devices. Array and multiple-wavelength dete
ctors reduce the need for mechanisms for wavelength multiplexing and o
ffer the possibility of simultaneous measurement of several wavelength
channels. The use of narrow-band semiconductor sources gives advantag
es for modulation arrangements. Using array sources, electronic wavele
ngth scanning becomes possible in some applications. The increased rea
l-time signal-processing capability can be used to implement more comp
lex measuring principles and efficiently compensate for disturbing eff
ects. Instead of using only a few wavelengths, a whole spectral band a
nalysis can be employed. As an example, real-time multielement analysi
s, with complex calibration functions, becomes a feasible industrial m
ethodology. The fields of application for infrared analysers can be fo
und in chemical process industries, food industries, energy production
, and environmental protection. Portable and integrated sensor-like an
alyser components substantially increase application markets.