Two different unmodified industrial CMOS processes have been used for
the integration of highly interdigitated pn structures. Under forward
bias these pn junctions emit narrow-band infrared light at 1160 nm wit
h an electrical-to-optical power conversion efficiency of typically 10
(-4). The same junctions show broad-band visible-light emission betwee
n 450 and 800 nm in the avalanche breakdown region under reverse bias
with efficiencies of the order of 10(-8). This is already enough for a
first few practical applications as light-emitting devices (LEDs). No
satisfactory explanation for this emission effect, fitting all the ex
perimentally observed electro-optical and physical properties of our s
ilicon LEDs, has been found yet.