Jf. Chen et al., TESTS OF BACKSCATTER COEFFICIENT MEASUREMENT USING BROAD-BAND PULSES, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 40(5), 1993, pp. 603-607
An adaptation to a data reduction method is outlined for determining b
ackscatter coefficients, eta when broad bandwidth pulses are employed.
The accuracy of these eta values is assessed with well-characterized
phantoms, which have independently calculated backscatter coefficients
based on their physical properties. One phantom produces Rayleigh-lik
e scattering, where the backscatter coefficient varies smoothly with f
requency over the analysis bandwidth. A second phantom exhibits local
maxima and minima in the scattering function versus frequency due to p
resence of millimeter sized graphite gel spheres in a gel background.
The method was found to produce accurate results using time gate durat
ions as small as 2 mus, although better accuracy is obtained for longe
r gate durations, particularly when the sample exhibits resonance peak
s in backscatter versus frequency. Use of a Hamming window in place of
a rectangular window extends the accuracy near the upper and lower li
mits of the frequency range.