BURN-IN ECONOMICS MODEL FOR MULTICHIP MODULES

Authors
ALANI A DISLIS C JALOWIECKI I
Citation
A. Alani et al., BURN-IN ECONOMICS MODEL FOR MULTICHIP MODULES, Electronics Letters, 32(25), 1996, pp. 2349-2351
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
32
Issue
25
Year of publication
1996
Pages
2349 - 2351
Database
ISI
SICI code
0013-5194(1996)32:25<2349:BEMFMM>2.0.ZU;2-I
Abstract
Bum-in is an essential part of semiconductor product screening to sign ificantly reduce or eliminate defective parts, hence improving product reliability. However, the cost implications of burn-in on some produc ts may be prohibitively expensive. The economics model of bum-in prese nted here helps predict the cost and quality implications of this proc ess for multi-chip modules.