TIME-CENSORED RAMP TESTS WITH STRESS BOUND FOR WEIBULL LIFE DISTRIBUTION

Authors
BAI DS CHUN YR CHA MS
Citation
Ds. Bai et al., TIME-CENSORED RAMP TESTS WITH STRESS BOUND FOR WEIBULL LIFE DISTRIBUTION, IEEE transactions on reliability, 46(1), 1997, pp. 99-107
Citations number
23
Categorie Soggetti
Computer Sciences","Engineering, Eletrical & Electronic","Computer Science Hardware & Architecture","Computer Science Software Graphycs Programming
Journal title
IEEE transactions on reliability → ACNP
ISSN journal
00189529
Volume
46
Issue
1
Year of publication
1997
Pages
99 - 107
Database
ISI
SICI code
0018-9529(1997)46:1<99:TRTWSB>2.0.ZU;2-3
Abstract
This paper considers ramp tests for Weibull life distribution when the re are limitations on test stress and test time. The inverse power law and a cumulative exposure model are assumed. Maximum likelihood estim ators of model parameters and their asymptotic covariance matrix are s hown. The optimum ramp test plans are given which minimize the asympto tic variance of the ML estimator of a specified quantile of log(life) at design constant stress. The effects of the pre-estimates of design parameters are studied.