SUBSTRATE EFFECTS AND CHEMICAL-STATE PLOTS FOR THE XPS ANALYSIS OF SUPPORTED TIO2 CATALYSTS

Citation
Vm. Jimenez et al., SUBSTRATE EFFECTS AND CHEMICAL-STATE PLOTS FOR THE XPS ANALYSIS OF SUPPORTED TIO2 CATALYSTS, Surface and interface analysis, 25(4), 1997, pp. 292-294
Citations number
18
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
25
Issue
4
Year of publication
1997
Pages
292 - 294
Database
ISI
SICI code
0142-2421(1997)25:4<292:SEACPF>2.0.ZU;2-4
Abstract
The analysis by XPS of TiO2 deposited on different substrates (SiO2, M gO, Ag, SnO) shows the existence of shifts in the Ti 2p binding energy and Auger parameter values. The magnitude of these shifts is a functi on of the support and of the coverage. A systematic representation of these shifts is possible with a chemical state plot. The implications of the existence of such shifts for the characterization of catalysts are discussed. (C) 1997 by John Wiley & Sons, Ltd.