Vm. Jimenez et al., SUBSTRATE EFFECTS AND CHEMICAL-STATE PLOTS FOR THE XPS ANALYSIS OF SUPPORTED TIO2 CATALYSTS, Surface and interface analysis, 25(4), 1997, pp. 292-294
The analysis by XPS of TiO2 deposited on different substrates (SiO2, M
gO, Ag, SnO) shows the existence of shifts in the Ti 2p binding energy
and Auger parameter values. The magnitude of these shifts is a functi
on of the support and of the coverage. A systematic representation of
these shifts is possible with a chemical state plot. The implications
of the existence of such shifts for the characterization of catalysts
are discussed. (C) 1997 by John Wiley & Sons, Ltd.