Surface and bulk mobilities of oligothiophene single crystals

Citation
Jh. Schon et al., Surface and bulk mobilities of oligothiophene single crystals, APPL PHYS L, 73(24), 1998, pp. 3574-3576
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
73
Issue
24
Year of publication
1998
Pages
3574 - 3576
Database
ISI
SICI code
0003-6951(199812)73:24<3574:SABMOO>2.0.ZU;2-5
Abstract
High-quality single crystals of alpha-quaterthiophene (alpha-4T) and alpha- hexathiophene (alpha-6T) were investigated to compare intrinsic bulk and su rface electrical properties. The bulk properties of these organic p-type se miconductors are derived from extended current-voltage characteristics and the surface properties from single crystal field-effect transistor measurem ents. Most significantly, charge carrier mobilities as high as 0.5 cm(2)/V s are observed in alpha-6T both in the bulk and at the surface. The high qu ality and purity of the crystals are evident from the low trap densities (< 10(15) cm(-3)) and the even lower dopant concentrations (2 x 10(13) for alp ha-4T and 7 x 10(10) cm(-3) for alpha-6T). These intrinsically high perform ance figures, together with the ease of processing, make these oligothiophe nes attractive materials for "plastic electronic'' devices. (C) 1998 Americ an Institute of Physics. [S0003-6951(98)02850-2].