Aj. Perry et al., DIFFRACTION PATTERN INDEXING AND THE EFFECT OF METAL-ION IMPLANTATIONON KAPPA-ALUMINA, Surface & coatings technology, 89(1-2), 1997, pp. 62-69
The X-ray diffraction pattern of kappa-Al2O3 in the form of a coating
over a Ti(C,N) interlayer has been indexed up to the 204 peak in terms
of the hexagonal super-lattice of the orthorhombic unit cell. The lat
tice parameters have been derived using silicon as standard of referen
ce; some peak overlaps were present. The coating is characterized by l
ow residual stress with a strong shear stress component, and a low str
ain distribution; this was not quantified. After a dual metal ion impl
antation with Ti and Ni, the residual stress in the kappa-Al2O3 was en
tirely removed, and the lattice parameters were measured as a=0.9624 n
m and c=O.8908 nm. In addition, the intensity of the diffraction peaks
was reduced to about 85% and the strain distribution of the 002, 200
and 201 peaks increased. It is thought that these effects are due to s
urface amorphization and the development of a dislocation substructure
, respectively.