A teflon surface roughening with sodium-naphthalene complex solution i
s investigated. The roughened surface properties and binding energy we
re examined by contact angle, surface roughness, scanning electron mic
roscopy (SEM) and X-ray photoelectron spectroscopy (XPS), respectively
. In the initial stage, XPS analysis shows that the intensity of the c
arbon-fluorine bonds decreases continuously due to the surface roughen
ing step, and the contact angle which is an indicator of surface wetta
bility also decreases. The surface roughness tends to increase during
the initial roughening step but then becomes smooth with additional ro
ughening. The most effective roughening time may be approximately 5-10
s; in this time range the relative concentration of fluorine atoms an
d contact angle are smaller, whereas the surface roughness of teflon s
urfaces are larger. The roughening effect on the teflon surfaces can a
lso be examined using SEM micrographs.