A digital background calibration technique for time-interleaved analog-to-digital converters

Citation
Dh. Fu et al., A digital background calibration technique for time-interleaved analog-to-digital converters, IEEE J SOLI, 33(12), 1998, pp. 1904-1911
Citations number
30
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF SOLID-STATE CIRCUITS
ISSN journal
00189200 → ACNP
Volume
33
Issue
12
Year of publication
1998
Pages
1904 - 1911
Database
ISI
SICI code
0018-9200(199812)33:12<1904:ADBCTF>2.0.ZU;2-W
Abstract
A 10-bit 40-Msample/s two-channel parallel pipelined ADC with monolithic di gital background calibration has been designed and fabricated in a 1- mu m CMOS technology. Adaptive signal processing and extra resolution in each ch annel are used to do digital background calibration. Test results show that the ADC achieves a signal-to-noise-and-distortion ratio of 55 dB for a 0.8 -MHz sinusoidal input, a peak integral nonlinearity of 0.34 LSB, and a peak differential nonlinearity of 0.14 LSB, both at a 10-bit level. The active area is 42 mm(2), and the power dissipation is 565 mW from a 5-V supply.