Identification of Zn site using XPS in Zn doped YBa2Cu3O7

X-ray photoelectron spectroscopy (XPS) measurements of Y-3d core-levels in Zn doped YBCO have been reported and evidence that Zn substitutionally occu pies Cu sites in the Cu-O plane layers has been provided. The Y levels show greater spectral complexity when Zn is incorporated into YBCO. Because Y i s sandwiched between plane layers, it is inferred that the spectral variati on can be attributed to the near proximity of substituted Zn atoms. This re sult indicates that XPS can be used as a local probe to identify the dopant site. The core level spectrum of the selective site is related to the occu pied density of states and to the charge in the chemical environment.