A model silicon/silicon oxide interface, synthesized from the spherosi
loxane H10Si10O15 and Si(100)-2x1, has been characterized by study of
the Si 2p core-levels and valence band region using soft X-ray photoem
ission. In addition, the intact H10Si10O15 cluster was condensed at -1
60 degrees C onto Si(111)-H and characterized. The measured photoemiss
ion features are in good agreement with the results of previous model
studies.