SPREADING RESISTANCE MEASUREMENTS IN P-N-JUNCTIONS - A SIMPLE TECHNIQUE

Authors
FABRIS L GOULDING FS MADDEN NW MANFREDI PF
Citation
L. Fabris et al., SPREADING RESISTANCE MEASUREMENTS IN P-N-JUNCTIONS - A SIMPLE TECHNIQUE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 386(2-3), 1997, pp. 470-473
Citations number
7
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
386
Issue
2-3
Year of publication
1997
Pages
470 - 473
Database
ISI
SICI code
0168-9002(1997)386:2-3<470:SRMIP->2.0.ZU;2-8
Abstract
A simple technique to extract the location and value of parasitic seri es resistance in junction devices is discussed and an instrument which performs these measurements is described. Measurements of gate series resistance on several high figure of merit junction field-effect tran sistors are presented. The limitations in noise behavior due to this r esistance are discussed.